2.830J – Control of Manufacturing Processes MIT OCW

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The objective of this subject is to understand the nature of manufacturing process variation and the methods for its control. First, a general process model for control is developed to understand the limitations a specific process places on the type of control used. A general model for process variation is presented and three methods are developed to minimize variations: Statistical Process Control, Process Optimization and in-process Feedback Control. These are considered in a hierarchy of cost-performance tradeoffs, where performance is based on changes in process capability.

1: Introduction — Processes and Variation Framework

Tuesday, January 27, 2009 5:06 AM

Topics covered: Introduction — processes and variation framework

Instructor: Duane Boning, David Hardt

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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2: Semiconductor Process Variation

Tuesday, January 27, 2009 5:06 AM

Topics covered: Semiconductor process variation

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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3: Mechanical Process Variation

Tuesday, January 27, 2009 5:06 AM

Topics covered: Mechanical process variation — physical causes and interpreting data

Instructor: David Hardt

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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4: Probability Models of Manufacturing Processes

Tuesday, January 27, 2009 5:06 AM

Topics covered: Probability models of manufacturing processes

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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5: Probability Models, Parameter Estimation, and Sampling

Tuesday, January 27, 2009 5:06 AM

Topics covered: Probability models, parameter estimation, and sampling

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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6: Sampling Distributions and Statistical Hypotheses

Tuesday, January 27, 2009 5:06 AM

Topics covered: Sampling distributions and statistical hypotheses

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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7: Shewhart SPC and Process Capability

Tuesday, January 27, 2009 5:06 AM

Topics covered: Shewhart SPC and process capability

Instructor: David Hardt

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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8: Process Capability and Alternative SPC Methods

Tuesday, January 27, 2009 5:06 AM

Topics covered: Process capability and alternative SPC methods

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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9: Advanced and Multivariate SPC

Tuesday, January 27, 2009 5:06 AM

Topics covered: Advanced and multivariate SPC

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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10: Yield Modeling

Tuesday, January 27, 2009 5:06 AM

Topics covered: Yield modeling

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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11: Introduction to Analysis of Variance

Tuesday, January 27, 2009 5:06 AM

Topics covered: Introduction to analysis of variance

Instructor: Hayden Taylor

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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12: Full Factorial Models

Tuesday, January 27, 2009 5:06 AM

Topics covered: Full factorial models

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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13: Modeling Testing and Fractional Factorial Models

Tuesday, January 27, 2009 5:06 AM

Topics covered: Modeling testing and fractional factorial models

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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14: Aliasing and Higher Order Models

Tuesday, January 27, 2009 5:06 AM

Topics covered: Aliasing and higher order models

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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15: Response Surface Modeling and Process Optimization

Tuesday, January 27, 2009 5:06 AM

Topics covered: Response surface modeling and process optimization

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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16: Process Robustness

Tuesday, January 27, 2009 5:06 AM

Topics covered: Process robustness

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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17: Nested Variance Components

Tuesday, January 27, 2009 5:06 AM

Topics covered: Nested variance components

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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18: Sequential Experimentation

Tuesday, January 27, 2009 5:06 AM

Topics covered: Sequential experimentation: “Experimentation and Robust Design and Engineering Systems.”

Instructor: Dan Frey

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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19: Case Study 1: Tungsten CVD DOE/RSM

Tuesday, January 27, 2009 5:06 AM

Topics covered: Case study 1: tungsten CVD DOE/RSM

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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20: Case Study 2: Cycle to Cycle Control

Tuesday, January 27, 2009 5:06 AM

Topics covered: Case study 2: cycle to cycle control

Instructor: David Hardt

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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21: Case Study 3: Spatial Modeling

Tuesday, January 27, 2009 5:06 AM

Topics covered: Case study 3: spatial modeling

Instructor: Duane Boning

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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22: Case Study 4: “Modeling the Embossing/Imprinting of Thermoplastic Layers.”

Tuesday, January 27, 2009 5:06 AM

Topics covered: Case study 4: “Modeling the Embossing/Imprinting of Thermoplastic Layers.”

Instructor: Hayden Taylor

Note: The slides used in this lecture can be found at the Lecture Slides tab

 

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