The objective of this subject is to understand the nature of manufacturing process variation and the methods for its control. First, a general process model for control is developed to understand the limitations a specific process places on the type of control used. A general model for process variation is presented and three methods are developed to minimize variations: Statistical Process Control, Process Optimization and in-process Feedback Control. These are considered in a hierarchy of cost-performance tradeoffs, where performance is based on changes in process capability.
Tuesday, January 27, 2009 5:06 AM
Topics covered: Introduction — processes and variation framework
Instructor: Duane Boning, David Hardt
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Semiconductor process variation
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Mechanical process variation — physical causes and interpreting data
Instructor: David Hardt
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Probability models of manufacturing processes
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Probability models, parameter estimation, and sampling
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
(CC BY-NC-SA)
Tuesday, January 27, 2009 5:06 AM
Topics covered: Sampling distributions and statistical hypotheses
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Shewhart SPC and process capability
Instructor: David Hardt
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Process capability and alternative SPC methods
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Advanced and multivariate SPC
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Yield modeling
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Introduction to analysis of variance
Instructor: Hayden Taylor
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Full factorial models
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Modeling testing and fractional factorial models
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Aliasing and higher order models
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Response surface modeling and process optimization
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Process robustness
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Nested variance components
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Sequential experimentation: “Experimentation and Robust Design and Engineering Systems.”
Instructor: Dan Frey
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Case study 1: tungsten CVD DOE/RSM
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Case study 2: cycle to cycle control
Instructor: David Hardt
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Case study 3: spatial modeling
Instructor: Duane Boning
Note: The slides used in this lecture can be found at the Lecture Slides tab
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Tuesday, January 27, 2009 5:06 AM
Topics covered: Case study 4: “Modeling the Embossing/Imprinting of Thermoplastic Layers.”
Instructor: Hayden Taylor
Note: The slides used in this lecture can be found at the Lecture Slides tab
(CC BY-NC-SA)
